JPH0330879U - - Google Patents

Info

Publication number
JPH0330879U
JPH0330879U JP9125589U JP9125589U JPH0330879U JP H0330879 U JPH0330879 U JP H0330879U JP 9125589 U JP9125589 U JP 9125589U JP 9125589 U JP9125589 U JP 9125589U JP H0330879 U JPH0330879 U JP H0330879U
Authority
JP
Japan
Prior art keywords
inspection
semiconductor integrated
functions
semiconductor
devices
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9125589U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP9125589U priority Critical patent/JPH0330879U/ja
Publication of JPH0330879U publication Critical patent/JPH0330879U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP9125589U 1989-08-02 1989-08-02 Pending JPH0330879U (en])

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9125589U JPH0330879U (en]) 1989-08-02 1989-08-02

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9125589U JPH0330879U (en]) 1989-08-02 1989-08-02

Publications (1)

Publication Number Publication Date
JPH0330879U true JPH0330879U (en]) 1991-03-26

Family

ID=31640753

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9125589U Pending JPH0330879U (en]) 1989-08-02 1989-08-02

Country Status (1)

Country Link
JP (1) JPH0330879U (en])

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004111029A (ja) * 2002-08-30 2004-04-08 Matsushita Electric Ind Co Ltd 半導体集積回路およびメモリのテスト方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6283678A (ja) * 1985-10-09 1987-04-17 Hitachi Ltd 試験パタ−ン発生器

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6283678A (ja) * 1985-10-09 1987-04-17 Hitachi Ltd 試験パタ−ン発生器

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004111029A (ja) * 2002-08-30 2004-04-08 Matsushita Electric Ind Co Ltd 半導体集積回路およびメモリのテスト方法

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